Abstract
This paper describes experimental studies on in-plane scattering of TE-polarized light in titanium-diffused Y-cut LiNbO <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> optical waveguides as a function of the diffusion process parameters of time, temperature, and the initial film thickness. The dependence of surface roughness on the waveguide fabrication parameters is also described. It has been found that as diffusion time and temperature are increased, in-plane light scattering firstly decreases but then eventually increases. The eventual increase in in-plane scattering is, apparently, because of growth of subsurface waveguide defects. From these studies, a reasonably consistent interpretation for the dependence of the quality of the optical waveguide on the waveguide fabrication parameters has emerged.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
