Abstract
Microstrip transmission lines in the form of ring resonators have been fabricated from a number of in-situ grown laser-ablated films and postannealed cosputtered YBa/sub 2/Cu/sub 3/O/sub 7-x/ (YBCO) films. The properties of these resonators have been measured at 35 GHz, and the observed performance is examined in light of the critical temperature (T/sub c/), film thickness, and the film morphology, which is different for the two deposition techniques. It is found that T/sub c/ is a major indicator of the film performance for each growth type, with film thickness becoming important as it decreases towards 1000 AA. It is also found that the films with a mixed grain orientation (both a-axis and c-axis oriented grains) have poorer microwave properties as compared with the primarily c axis oriented material. It is speculated that this is due to the significant number of grain boundaries between the different crystallites, which may act as superconducting weak links and contribute to the surface resistance.
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