Abstract
A series of X-ray photoelectron spectroscopic (XPS) measurements for testing the performance and determining the spectrometer function of electron spectrometers is described. The method is based on the determination of the natural line width Rh 3d 5/2 in Rh metal by the help of the Coster-Kronig broadening and Auger intensity ratio evaluated from the Rh 3d 3/2 and M45N45N45 Auger spectra, respectively. Applicability of the method is demonstrated in the case of different electron spectrometers, comparing the data obtained in this way to the results of an alternative procedure based on the analysis of conduction band photoelectron spectra of Rh metal samples.
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