Abstract
ABSTRACT The widespread application of machine vision system promotes the development of image-based statistical process control methodologies to improve the utilization of image data. Previous research has focused on either identification of fault size and/or location or detection of fault occurrence. There is limited research on both fault detection and identification. In this paper, an EWMA and region growing based control charting method is proposed for monitoring images of industrial products of which quality is either characterized by uniformity (e.g. LCD monitors) or a specific pattern (e.g. manufactured tiles). Simulation results show that the proposed method is not only effective in quick detection of the fault but also accurate in estimating the fault size and location. An experimental study is also provided to highlight how practitioners can implement the proposed method in applications.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.