An event-oriented reliability assessment for DC link capacitors in grid connected inverter with low voltage ride through operation

Abstract

Low voltage ride-through (LVRT) capability has been standard into the operating specifications of grid-connected inverters in many countries. Due to the mismatch of the time scale and lack of stress description model under the LVRT operation, the traditional mission profile reliability analysis tools are difficult to be applied for capacitors under LVRT operation. To overcome the above issue, this paper analysis the electrical and thermal stress of the DC link capacitors under LVRT operation, and established a lifetime model for the LVRT operation by the accelerated aging test. An extended mission profile and a nonlinear damage accumulation model have been proposed to evaluate the impact of the LVRT event on the reliability of DC link capacitors. A reliability assessment has been conducted for a 7.5 kW inverter which experienced one LVRT incident as an analytical example.