An event gate module for spark chamber experiments

Abstract

The instrument described is designed for spark chamber experiments in which more than one event per beam spill is to be recorded. It generates gate pulses that turn off selected logic and scaling circuits during the intervals between beam spills, during each spark chamber discharge and during film advance or on-line data processing. Thus, well defined artificial “dead times” are introduced. Timing pulses denoting the beginning and end of each beam spill must be supplied externally, but the other artificial “dead times” can be determined either internally or externally. The instrument also provides trigger pulses for spark chamber drivers and recording circuitry.