Abstract
Without a large number of precision reference voltages and with the consideration of matching problems, a builtin-self-test approach is proposed to test the parameters of digital-to-analog converter (DAC), which includes offset error (VOSE); gain error (GFSE), differential nonlinearity (DNL) error, and integral nonlinearity (INL) error. The proposed structure is designed and simulated in an 8-bit DAC by using TSMC 0.35 /spl mu/m 2P4M process. The accuracy of offset error test, gain error test, and DNL test are all beneath 1/11 LSB for 8-bit DAC at 5V supply voltage, and the accuracy of INL test depends on the testing time. The longer testing time, the more accurate is.
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