Abstract

Conventional multivariate cumulative sum control charts are more sensitive to small shifts than [Formula: see text] control charts, but they cannot get the knowledge of manufacturing process through the learning of in-control data due to the characteristics of their own structures. To address this issue, a modified multivariate cumulative sum control chart based on support vector data description for multivariate statistical process control is proposed in this article, which is named [Formula: see text] control chart. The proposed control chart will have both advantages of the multivariate cumulative sum control charts and the support vector data description algorithm, namely, high sensitivities to small shifts and learning abilities. The recommended values of some key parameters are also given for a better application. Based on these, a bivariate simulation experiment is conducted to evaluate the performance of the [Formula: see text] control chart. A real industrial case illustrates the application of the proposed control chart. The results also show that the [Formula: see text] control chart is more sensitive to small shifts than other traditional control charts (e.g. [Formula: see text] and multivariate cumulative sum) and a D control chart based on support vector data description.

Highlights

  • In modernized manufacturing process, inspired by applications of more advanced technologies and industrial expansion, a manufacturing system usually is composed of two or more correlated quality characteristics and it is essential to monitor and control all these quality variables simultaneously

  • Interested readers can refer to Wang et al.[20]. They used genetic algorithm (GA) to search the optimal parameter combination of support vector regression (SVR)[21] and the results showed that their GA-SVR method was better than the mathematical regression model and artificial neural network (ANN).[22,23,24]

  • The results show that the D-multivariate cumulative sum (MCUSUM) control chart is better than the D control chart and the T 2 control chart as a whole

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Summary

Introduction

In modernized manufacturing process, inspired by applications of more advanced technologies and industrial expansion, a manufacturing system usually is composed of two or more correlated quality characteristics and it is essential to monitor and control all these quality variables simultaneously. The experimental results indicated that their method was similar to the MCUSUM control chart in detecting a shift in the mean vector of a multivariate normal distribution. A modified multivariate control chart based on SVDD is proposed to monitor the shift of manufacturing process, which is called D-MCUSUM control chart.

Results
Conclusion
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