Abstract
An effective logic built-in self-test scheme aiming at reducing the area overhead of IC testing and improving the fault average is proposed, which combines strategies of linear feedback shift register (LFSR)-reseeding with test vectors applied by circuit-under-test itself (TVAC). LFSR-reseeding technology is first applied to decrease the size of test set and the number of interior feedback wires, while TVAC technology is applied to decrease the number of stored seeds. An efficient LFSR-reseeding algorithm and a modified quick judgment method for path search are proposed. Experimental results for ISCAS 85 benchmarks demonstrate that the proposed method reduces the number of interior feedback wires more than 50% on average and can achieve full fault coverage with much less groups as well as area overhead compared with previous TVACs.
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