Abstract
A simple method for magnetoresistance measurements in weak fields based on using a low-frequency alternating magnetic field is proposed. The special feature of this method is the direct measurement of the difference in resistance ΔR of the sample under study in the field and in the absence of the field, which offers a chance to significantly increase measurement sensitivity. The automatic setup for measuring temperature dependencies of magnetoresistance of film metallic samples with a ΔR sensitivity of up to 10−7 Ω is described. The temperature dependencies of magnetoresistance of thin-film nanocrystalline Co-Cu alloy samples in weak magnetic fields and in a temperature range of 77–300 K are studied.
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