An Automatic DFT System for the Silc Silicon Compiler

Abstract

This article discusses design for testability automation for the Silc silicon compiler under development at GTE Laboratories, Inc. Our modular design for testability uses both built-in self-test and scan-path techniques for Slic's full custom VLSI designs. A test controller coordinates the testing of the chip's modules. Testability evaluation is performed using controllability/observability methods, and using a method based on information theory. A testable-by-construction approach is followed in order to synthesize blocks of testable logic. A testability ?expert? manages testability knowledge during the synthesis process and makes the ultimate testability decisions.