Abstract
Silicon Photomultipliers (SiPMs) are rapidly developing photosensitive devices which are already used as an alternative to photomultipliers (PMT) in the newly developed calorimeters for high-energy physics. Many measurement results and SIPMs parameters based on signal amplitude histograms analysis have been published. Author presents a special automated system for scanning SIPMs surfaces with a fast amplifier. The system has been developed in order to examine shape of signal response dependency on position of photons hits on the surface of the detector.
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