Abstract
Stoichiometric NiAl doped with 0.24 at% beryllium has been studied using atom probe field ion microscopy (APFIM). Composition measurements revealed that almost all the beryllium remained in solid solution in the matrix. Atom probe analysis of the (100) alternating pure nickel and pure aluminum planes determined the occupancy of beryllium to be almost exclusively at aluminum sites. A low number density of coarse MC precipitates, originating from trace impurities in the alloy, were found along the grain boundaries and within the grains. These coarse MC precipitates occurred in too low a number density to make any significant contribution to the observed increase in yield strength. The small increase in the yield strength that accompanied the beryllium addition to NiAl was from a weak solid solution strengthening mechanism from the substitutional beryllium atoms in the matrix.
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