Abstract

ContextThe Bidirectional Reflectance Distribution Function (BRDF) represents a material through the incoming light on its surface. In this context, material clustering contributes to selecting a basis of representative BRDFs, the reconstruction of BRDFs, the personalization of the appearance of materials, and image-based estimation of material properties. ObjectiveThis work presents an approach to cluster a BRDF database according to its reflectance features. MethodWe first preprocess a BRDF database by mapping it to an image slice database and then find the best parameters for the LLE method through an empirical analysis, retrieving lower-dimensional databases. We performed a controlled experiment using the k-means, k-medoids, and spectral clustering algorithms applied to the low-dimensional databases. ConclusionK-means presented the best overall result compared to the other clustering algorithms. For applications that require cluster representatives from the database, we suggest using k-medoids, which presented results close to those of the k-means.

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