Abstract
AbstractAnalysis and confirmation of monolayer film thickness on metal oxide surfaces has proven to be challenging. XPS and AFM have been used to investigate the monolayer formation. However, these techniques are difficult to access and/or determine the composition of the organic molecules on the surfaces. Here we demonstrate the ability of MALDI‐TOF to characterize long alkyl chain phosphonic acid molecules in thin films on titanium, iron and stainless steel. These systems are known to be stable, strongly adhered films. The thin films were characterized by IR, AFM, contact angle measurements and the results were confirmed by MALDI‐TOF. Moreover, the MALDI‐TOF was used to differentiate between mono‐ and multilayers on planar surfaces. Copyright © 2007 John Wiley & Sons, Ltd.
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