Abstract
Although various multivariate process monitoring techniques have been developed, they do not diagnose the process for finding the root causes of irregularities during production. There have been recent studies on a new method that involves process‐oriented basis representation, which links the process variation to its causes, and thus helps in monitoring and diagnosing a process. However, all the studies done so far focused on its application. In this paper, a method is proposed to build the process‐oriented basis for a process irrespective of the number of variables characterizing it. Along with various other statistical techniques, factor analysis and cluster analysis, with customized distance function, are used in developing the method. The built in process‐oriented basis is further used for multivariate statistical process control and process capability analysis. Multivariate solder‐paste problem from electronics industry is used for illustration. Copyright © 2012 John Wiley & Sons, Ltd.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
