Abstract
A novel method of achieving a negative index of refraction in the far-infrared region using intrinsic material properties is proposed. SrTiO3 has a dielectric resonance at ∼100 cm−1 that can be lowered by lowering the temperature or with Ba doping. NiO has an antiferromagnetic resonance at ∼35 cm−1 that can be raised with an applied field or with Co doping. These resonance frequencies can therefore be engineered to occur at the same frequency to achieve a negative index of refraction over an interval just above the coincident resonance. We show that SrTiO3 and NiO are readily chemically compatible and non-reacting at temperatures up to 1550 °C and can be formed into polycrystalline composite bodies. Epitaxial thin film heterostructures of (SrTiO3/NiO)n/MgO with n = 1, 2 have also been fabricated with very high crystal quality.
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