Abstract
Surface roughness of electrodes plays a key role in the dielectric breakdown of thin-film organic devices. The rate of breakdown will increase when there are stochastic sharp spikes on the surface of electrodes. Additionally, surface having spiking morphology makes the determination of dielectric strength very challenging, specifically when the layer is relatively thin. We demonstrate here a new approach to investigate the dielectric strength of organic thin films for organic light-emitting diodes (OLEDs). The thin films were deposited on a substrate using physical vapor deposition (PVD) under high vacuum. The device architectures used were glass substrate/indium tin oxide (ITO)/organic material/aluminum (Al) and glass substrate/Al/organic material/Al. The dielectric strength of the OLED materials was evaluated from the measured breakdown voltage and layer thickness.
Highlights
Organic light-emitting diodes (OLEDs) have drawn enormous attention in both academia and industry owing to their cumulative applications in high-quality flat-panel displays and solid-state lighting [1,2,3,4,5,6]
Reduction of heat and dissipation is required in order to increase the lifetime of organic light-emitting diodes (OLEDs) [13]
Device efficiency and lifetime start to decline at a higher driving voltage. This failure and the thickness of organic layers, OLED devices need higher voltage in order to achieve more of OLED devices is mainly due to dielectric breakdown of the organic material
Summary
Organic light-emitting diodes (OLEDs) have drawn enormous attention in both academia and industry owing to their cumulative applications in high-quality flat-panel displays and solid-state lighting [1,2,3,4,5,6]. Nguyen et al analyzed frequency-dependent capacitive response in indium tin oxide (ITO)/ poly(pelectrochemical cells (LEC), and propsed an equivalent circuit with a series combination of series phenylene vinylene) (PPV)/ aluminum (Al) devices, such as conductance and tan δ [15]. Device efficiency and lifetime start to decline at a higher driving voltage This failure and the thickness of organic layers, OLED devices need higher voltage in order to achieve more of OLED devices is mainly due to dielectric breakdown of the organic material. For a The thin produced film electric field sufficient toVcause dielectric breakdown most volts/cm of the OLED [20]. The produced study, we attempted to discover correlation between surface of the electrode electric field is sufficient to causethe dielectric breakdown of most of theroughness. By evaluating the breakdown voltage and layer thickness [21]
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