Abstract
A spin-polarized scanning electron microscope (SP-SEM) with a retarding-type Mott analyzer was developed. For SP-SEM applications, we improved the figure of merit of the polarimeter, which had been developed in our laboratory, and employed a newly designed secondary electron collector. To avoid the magnetic stray field generated by the magnetic objective lens, a magnetic shield whose shape was designed by means of the finite element method was attached to the lens. Using the SP-SEM system, we observed spin-dependent SEM images of the domain structure of a single Fe crystal (001) surface, and typically observed spin polarization of secondary electrons of about ±14%.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
