Abstract
A multiple-valued input two-valued output logic system (MITOL) is proposed as a description language of software functionality for test case generation purpose. Based on the MITOL description of software functionality, test generation algorithms for multiple-valued logic circuits, such as path sensitization, can be used for test case generation for software system functional testing. The resulting minimum complete test set contains the minimum number of test cases to cover all logical stuck-at-faults. Finally, a comparison of this new method with traditional methods is presented.
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