Abstract
Secondary ion, secondary electron and photon emission represent inelastic effects in the collision processes occurring at ion-bombarded surfaces. Such effects have become of interest to a number of research groups, both for their fundamental importance to our understanding of ion-surface interaction and also for their potential in surface analysis. In this paper we wish to describe a new system for the study of photon and secondary ion emission and to give some preliminary results of experiments we have been conducting.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.