Abstract
AbstractMeasurements have been made of positive secondary ion currents from oxygen bombardment of glass standards, obtained either from NBS or specially prepared in this laboratory. By using one fitting parameter, the ionization temperature Ti, a semi‐quantitative analysis (accurate to within a factor of 2–3) is possible on any one of these standards. This approach, whilst achieving an accuracy comparable to that obtainable using relative sensitivity factors, does not restrict the analysis to those elements for which sensitivity factors are available. Further, change of sample matrix, which can alter sensitivity factors in a seemingly puzzling fashion, can easily be rationalized and accommodated through variation in Ti. Values of Ti for 16 binary oxides lie between 5500 and 9500 K. The Ti value for a more complex matrix can be estimated on a proportional basis from these binary oxide results.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
