An Accurate Datasheet-Based Full-Characteristics Analytical Model of GaN HEMTs for Deadtime Optimization

Abstract

The gallium nitride high electron mobility transistors (GaN HEMTs) are a superior candidate for the new-generation power electronics systems with higher efficiency and power density. However, due to the unique reverse characteristics, the reverse voltage drop of GaN HEMTs is much higher than that of diode. The deadtime loss in GaN-based bridge converters will be comparable to switching losses if the deadtime is not optimized. To optimize the deadtime for higher efficiency, this article proposes an accurate analytical model of GaN HEMTs, including circuit's parasitic inductances, the nonlinear capacitances, the unique reverse characteristics, etc. Taking a GaN-based synchronous buck converter as the example, the proposed model is realized, which fully uses the datasheet to avoid additional experiments. In order to accurately measure the switching current for validation, a novel parasitics-based current measurement method is proposed. The proposed model is verified by simulation in LTspice and experiment, and good agreement is shown. Based on the accurate analytical model, the deadtime is optimized for different load currents to improve the efficiency within the full load range. Compared with the fixed deadtime of 15 ns, the increase of efficiency can be up to 8%. This work will promote the high-frequency application of GaN HEMTs.