Abstract

During the package processes, including chip attachment and encapsulation, the stress caused by the thermal and mechanical load is usually generated in integrated circuit chips. This brief developed a mechanical stress sensor in a standard 180nm CMOS process for runtime stress measurement. The contributions done in this brief are summarized as follows: 1) A temperature-compensation RC oscillator circuit converts the warpage of the die induced by the mechanical stress into the frequency output. It even can measure the thermally induced stresses with a wide temperature range. The oscillator has a frequency variation of −0.808% from temperature stability measurements from <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$- 40^{\circ }\text{C}$ </tex-math></inline-formula> to <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$120^{\circ }\text{C}$ </tex-math></inline-formula> . 2) Rather than the complicated calibrations and advanced measurement equipment, the frequency can be easily measured with the chip area less than 0.569 mm2 and the power consumption less than 22.9 <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu \text{W}$ </tex-math></inline-formula> . 3) As for the sensing array, the sensitivity and stability of the metal-insulator-metal (MIM) and metal–oxide–metal (MOM) capacitors are verified. The measured average sensitivity of the test chip using a MIM capacitor with 0.1736 Hz/kPa is more sensitive than that using a MOM capacitor with 0.102 Hz/kPa. The linear fit curves of the output frequency have the coefficient of determination ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\text{R}^{2}$ </tex-math></inline-formula> ) of 0.9983 for MIM and 0.9959 for MOM, indicating an excellent linear response of the sensor circuit.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call