Abstract

A thin-film nonlinear spin wave interferometer has been experimentally studied. The concept of a quasi-nonlinear operation regime is introduced for the first time and the boundaries of the quasi-nonlinear dynamic range of the interferometer are experimentally determined. It is shown that the nonlinear spin wave interferometer operating in the quasi-nonlinear regime can be characterized, like linear devices, by the amplitude-frequency characteristic (AFC). However, an increase in the signal power level within the quasi-nonlinear dynamic range at the input of the nonlinear interferometer leads, in contrast to the case of a linear device, to a frequency shift of the AFC. An analysis of the AFC shift indicates that a 180° change in the phase difference between the interfering signals at each separate frequency is achieved for the input power varied within the limits of the quasi-nonlinear dynamic range. This behavior shows the possibility of using the nonlinear interferometer for the processing of microwave signals without undesired distortion of the signal waveform.

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