Abstract
The 1⁄2-phase transformation and ¢-phase stability in TixNb (28 x 40 at%) single crystals were investigated using electrical resistivity measurements, transmission electron microscopy (TEM) observations, and specific heat measurements. The crystal for x = 28 exhibits distinct anomalous negative temperature dependence of the resistivity coefficient and thermal hysteresis accompanied by the presence of the athermal 1⁄2phase and ¢-phase lattice modulation. Although the crystal for x = 30 appears in the ¢-phase lattice modulation, it does not exhibit a clear negative temperature dependence of the resistivity coefficient or the athermal 1⁄2-phase. The crystal of x = 30 also shows a relatively high absolute value of resistivity at 15K among the crystals for 28 x 40 and a low Debye temperature in a normal conductive state. The crystal for x = 30 that shows the lattice modulation, high resistivity, and low ¢-phase Debye temperature correspond to the low stability of the ¢-phase. Moreover, the stability strongly depends on the Nb content of the binary TiNb crystal. [doi:10.2320/matertrans.MC201202]
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