Abstract

We report on electron and hole drift mobility, lifetime and range measurements on vacuum coated stabilized a-Se (a-Se alloyed with As and doped with Cl) X-ray photoconductor type layers as a function of the substrate temperature Tsubstrate during deposition; Tsubstrate has been varied from 6 to 66°C covering the glass transition temperature of a-Se (about 40°C). We find the electron mobility, lifetime and range show essentially no dependence on Tsubstrate, whereas for holes, although the drift mobility is not significantly affected, the lifetime deteriorates rapidly with decreasing Tsubstrate. We also re-examine and discuss the charge conversion efficiency of a-Se X-ray photoconductors by reanalyzing the electron–hole pair creation energy (W±) vs. field data, and evaluating the saturated (minimum) W± from the W± vs. reciprocal field plot.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.