Amorphous HgCdTe infrared photoconductive detector with high detectivity above 200 K

Abstract

Temperature dependence of dark current (Id) and photocurrent (Iph) is reported for Si-based amorphous HgCdTe (a-MCT) infrared photoconductive detector at 80-300 K. It is indicated that an uncooled a-MCT infrared detector can be fabricated based on the Si-based a-MCT. To describe the transport process, the Mott and Davis model [Davis and Mott, Philos. Mag. 22, 903 (1970)] is proposed as the conducting model originally developed for amorphous silicon. A possible mechanism of the carrier transports is shown in the a-MCT materials. The transport transition between the localized and extended carriers leads to the maximal Iph/Id above 200 K.