Abstract
ABSTRACTThe semiconducting crystalline alloys, Ge1−xSnx, are of interest due to theoretical predictions about their electronic band structures which make them useful in infrared photodetectors. However the composition region where these alloys have the desired properties is greater than the equilibrium solid solubility limit of Sn in Ge (x<0.01). We have circumvented the solubility limits and produced thin (2000Å) and thick (4–8Μm) films of Gei.xSnx (x<0.31) by rf sputtering. Differential scanning calorimetry (DSC) Measurements were performed to study grain growth and crystallization processes in these highly metastable semiconductors. X-ray and electron diffraction measurements indicated the materials were amorphous, but the fact that some of the films were fine grained polycrystalline samples only became apparent in their DSC spectra. We present models that describe quantitatively the transformation behavior in both sets of films.
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