Ambient pressure mapping of resonant Auger spectroscopy at BL02B01 at the Shanghai Synchrotron Radiation Facility.

Abstract

During the past few decades, resonant Auger spectroscopy (RAS) has presented some advantages in elucidating the electronic structure of free molecules, liquids, and solids. To further extend the application of RAS in complex in situ environments, the ambient pressure system should be developed to characterize the gas-solid and liquid-solid interfaces. In this paper, we describe the design and performance of an ambient pressure mapping of resonant Auger spectroscopy (mRAS) system newly developed at BL02B01 at the Shanghai Synchrotron Radiation Facility. This system is unique in that the ambient pressure soft x-ray absorption spectroscopy (sXAS) can be measured in Auger electron yield with kinetic energy (KE) resolved. We can obtain a mapping of the resonant Auger spectroscopy (mRAS) in the near ambient pressure environment. This approach provides an additional dimension of information along the KE of Auger electrons to reveal details of the valence and unoccupied states at the vicinity of the absorption edge. Complementary to the photoemission spectroscopy that probes the core levels, in situ two-dimension mRAS characterization is useful in studying the electronic structure of complex interfaces of gas-solid and liquid-solid under realistic operating conditions. We herein present the in situ oxidation of Cu(111) in the ambient oxygen environment as demonstration of the mRAS capability. Specifically, resolving the Auger features gives valuable clues to the molecular level understanding of chemical bonding and the evolution of orbital hybridization. In addition, the mRAS results of spatial resolution and mbar range gas pressure are shown and discussed.