Abstract

We propose an unsupervised segmentation method based on simple non-iterative clustering (SNIC) and adaptive density-based spatial clustering of applications with noise (DBSCAN). The method is not sensitive to parameter settings. And cluster parameter suitable for each image can be automatically calculated. SNIC superpixel segmentation is applied in achieving over-segmented images to solve the problem of the image resolution being too high. Then, adaptive DBSCAN clustering is proposed to cluster the over-segmented superpixel blocks to solve the problem of over-segmentation and manual adjustment of DBSCAN parameters. Finally, k-means and connected regions are used for postprocessing to remove the shadow superpixel blocks from the clustered image and to ensure the integrity of a single microstructure. The effectiveness of this method is proved by many experiments. Based on this method, we provide a fast labeling method to help experts quickly label metallographic images.

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