Allocation of test times in multi-state svstems for reliability growth testing

Abstract

This paper generalizes a reliability growth test allocation problem to series-parallel multi-state systems. An algorithm, which determines the testing time for each system element in order to maximize the entire system reliability when total testing resources are limited, is suggested. The algorithm can handle both repairable and non-repairable multi-state systems. The Crow/AMSAA reliability growth model is used to evaluate the influence of testing time on the reliability of the elements composing the system. System reliability is defined as the ability of the system to satisfy variable demand represented by a cumulative demand curve. To evaluate multi-state system reliability, a universal generating function technique is applied. A Genetic Algorithm (GA) is used as an optimization technique. The basic GA procedures adapted to the given problem are presented. Examples of the determination of reliability growth test plans are demonstrated.