Abstract
A compact 110 GHz scattering-scanning near-field microscope is proposed and demonstrated. With employing a sub-harmonic IQ mixer as the dual-output demodulator, the microscope successfully acquires steady and background-free near-field-phase and -amplitude images with a resolution of ~130 nm, and obtains the ability of the all-time capture of near-field phase information under ambient conditions. To optimize the performance of microscope, the signal-extraction algorithm and influences of tip parameters on image quality are also introduced and analyzed in detail. It has been proven that the experimental results are quite consistent with our theoretical analysis. Besides, refer to present instrument setup and signal-extraction algorithm, the microscope has the potential to be expanded to higher operating frequency bands. These indicate that the microscope is a promising tool to realize the high-quality nano-imaging in low-terahertz band.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
