Abstract
The Schottky-collector resonant-tunnel-diode (SRTD) is an resonant-tunnel-diode with the normal N + collector layer and ohmic contact replaced by direct Schottky contact to the space-charge layer, thereby eliminating the associated parasitic series resistance Rins. By scaling the Schottky collector contact to submicron dimensions, the device periphery-to-area ratio is increased, decreasing the periphery-dependent components of the parasitic resistance, and substantially increasing the device's maximum frequency of oscillation. We report measured d.c. and microwave parameters of planar SRTDs fabricated with 1 μm-geometries in AlAs/GaAs.
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