Abstract
In the present study, device geometry having top contact bottom gated poly(2,5-bis(3-tetradecylthiophen-2yl)thieno(3,2-b)thiophene) (PBTTT) based polymer thin film transistor (PTFT) is reported to measure the changes in electrical responses with the exposure to various concentrations of ammonia vapor at room temperature. PTFT is preferred over other electronic devices due to its multi-parameter characteristics to explore gas sensing capabilities. A facile floating–film transfer method (FTM) is used to prepare an active layer of PTFT by forming optimized thin layer of PBTTT film having a thickness of ∼25nm. Exposure to various concentrations of ammonia vapor, device parameters like I/O characteristics, mobility, threshold voltage, and trap density are found to change significantly. As PTFT is exposed to 100ppm ammonia vapor a 70% reduction in mobility is observed whereas threshold voltage shifted to more negative from −17.62V to −23.64V. Better sensing capabilities with a detection limit of 0.33ppm, fast response and recovery of exposed ammonia vapor are observed, when PTFT is operated in sub-threshold regime rather than the cut-off or saturated regime. All the electrical characterizations for the sensing purpose are carried out in ambient but in a closed chamber. Device shows enormous potential for ammonia sensing for real and environmental applications.
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