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Abstract
We present the results on aging mechanisms acting in high-power laser diode arrays (LDAs) employing Fourier-transform (FT) spectroscopy. The FT spectrometer was used as an excitation source for performing photocurrent (PC) measurements in two sets of aged LDA samples. The PC spectra reveal both the evolution of a defect band located in the optically active layer as well as modifications of the interband part of the spectrum upon aging. Such changes represent sensitive quantitative measures of the aging status and provide insight into the microscopic changes of the device structure upon aging.
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