Abstract
This paper describes the present status of aging studies in various photosensitive detectors. New experimental data are presented on aging of trimethylamine (TMA) and ethylferrocene (EF) photosensitive vapors as well as on CsI and SbCs photocathodes. A new explanation of the aging process for CsI photocathodes based on solid-state physics theory is given. Finally, based on our studies, a general conclusion is made that thin polymer deposits on a detector's cathode due to aging can provoke breakdowns through the Malter-type mechanism, or more precisely, via an explosive field emission mechanism.
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