Abstract
The silver migration effect into the metastable phase forms a micro-electric path, to enhance the relative dielectric permittivity of CaCu3Ti4O12 ceramics for electronic devices. Controlling the sintering time uniquely develops the metastable phase of as-sintered CaCu3Ti4O12 ceramics. A post-heating process that applies the migration of silver into the metastable phase increases the relative dielectric permittivity. At 1 kHz frequency, the relative dielectric permittivity at room temperature of the silver-migrated CaCu3Ti4O12 ceramics sintered for 2 h is 565.9 × 103, almost 52 times higher than that of the as-sintered CaCu3Ti4O12 ceramics. The selected area electron diffraction (SAED) patterns of the large and small grains were similar, but differed from those of the metastable region, including the grain boundary of the as-sintered CaCu3Ti4O12 ceramics sintered for 2 h by TEM technique. This phenomenon suggests that enabling Ag-migration into the metastable phase develops a micro-electric path that improves the relative dielectric permittivity of CaCu3Ti4O12 ceramics.
Highlights
Due to their outstanding electrical properties, various perovskite titanate materials have played key roles in functional electronic devices[1]
We have attempted to control the phase of CCTO ceramics, expecting that controlling the sintering time could achieve a metastable phase of CCTO ceramics
The metastable phase of CCTO ceramics was designed and prepared with the intention of employing the Ag-migration process to develop a micro-electric path into the CCTO ceramics
Summary
Due to their outstanding electrical properties, various perovskite titanate materials have played key roles in functional electronic devices[1] Among these materials, calcium copper titanate (CCTO; CaCu3Ti4O12) ceramics have attracted considerable attention in recent years, due to their high relative dielectric permittivity[1,2,3]. Ceramics, and the migration of metallic material into the metastable phase can generate the micro-electric path. We assumed that migrating the metallic component into the metastable phase in the ceramic component, forms the micro-electric path, and as a result, enhances the capacitance. Measurement of the relative dielectric permittivity, energy dispersive spectroscopy (EDS) and current density–electric field (J–E) properties in the fully sintered phase and partially sintered phase enabled the Ag-migration effect in CCTO to be analyzed and characterized
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