AFM nanoindentation of viscoelastic materials with large end‐radius probes

Abstract

AbstractWe used atomic force microscopy (AFM) nanoindentation to measure mechanical properties of polymers. Although AFM is generally acknowledged as a high‐resolution imaging tool, accurate quantification of AFM nanoindentation results is challenging. Two main challenges are determination of the projected area for objects as small as AFM tips and use of appropriate analysis methods for viscoelastic materials. We report significant accuracy improvements for modulus measurements when large end‐radius tips with appropriate cantilever stiffnesses are used for indentation. Using this approach, the instantaneous elastic modulus of four polymers we studied was measured within 30 to 40% of Dynamic Mechanical Analysis (DMA) results. The probes can, despite their size and very high stiffnesses, be used for imaging of very small domains in heterogeneous materials. For viscoelastic materials, we developed an AFM creep test to determine the instantaneous elastic modulus. The AFM method allows application of a nearly perfect stepload that facilitates data analysis based on hereditary integrals. Results for three polymers suggest that the observed creep in the materials has a strong plastic flow component even at small loads. In this respect, the spherical indenter tips behave like “sharp” indenters used in indentation studies with instrumented indenters. © 2009 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 47: 1573–1587, 2009