AFM in surface finishing: Part IV. Force–distance curves

Abstract

The atomic force microscope is a high resolution imaging tool that can be used to obtain a wealth of information about the samples under study. Whereas in early work, the AFM tip was primarily used to scan surfaces to produce topographical data, it now finds application in the characterisation of surfaces at the microscopic and submicroscopic scale. It can be employed to probe surfaces to obtain local physical information, such as surface tension, compliance and adhesion data via the acquisition of force–distance curves. Although the AFM is largely a research tool at present, this technique will become increasingly important for the characterisation of coatings, particularly those that are organic in nature, i.e. paints and polymers.