AFM, EDS and XRD Microstructural Characterizations of Pd-Ag/PSS Membranes

Abstract

In the present investigation, dense, defect free palladium and palladium-silver alloy membranes were prepared on porous stainless steel by means of the sequential electroless plating technique. Full characterizations of the Pd-Ag/PSS membranes were performed using scanning electron microscopy (SEM), energy dispersive spectroscopic analysis (EDS), atomic force microscopy (AFM), and an X-ray diffractometer (XRD). AFM images showed that in the electroless plating process, lower skin layer roughness and a lower deposition rate were related. Although deposition was conducted through a sequential process, the surfaces on or inside the substrate showed homogenous deposition, as determined through EDS analysis. XRD reflection peaks indicated that the palladium and silver together formed a homogeneous alloy after annealing. The relationship between the average lattice spacing and peak positions can be used to estimate the membrane composition.