Abstract
Auger electron spectroscopy line‐shape analysis of the Tl(NOO), Ba(MNN), Ca(LMM), Cu(LMM) and O(KLL) peaks has been performed in conjunction with electron energy loss spectroscopy (EELS) on magnetron sputter deposited TlBaCaCuOx thin films a superconducting onset at 110 K with zero resistance at 96 K. AES and EELS analyses were performed at 300 K and at 100 K. Changes in the Auger line shapes and in the EELS spectra as the temperature is lowered below the critical point are related to changes in the electronic structure of states in the valence band (VB). Bulk and surface plasmon peaks are identified in the EELS spectra along with features due to core level transitions. Electron beam and ion beam induced effects are also addressed.
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