Abstract
It was demonstrated that optical modulation together with simultaneous terahertz (THz) imaging application enables an increase in contrast by an order of magnitude, thereby illustrating the technique as a convenient contactless tool for characterization of graphene deposited on high-resistivity silicon substrates. It was shown that the single- and double-layer graphene can be discriminated and characterized via variation of THz image contrast using a discrete frequency in a continuous wave mode. Modulation depth of 45% has been reached, and the contrast variation from 0.16 up to 0.23 is exposed under laser illumination for the single- and double-layer graphene, respectively. The technique was applied in the development and investigation of graphene-based optical diffractive elements for THz imaging systems.
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