Abstract
The use of polarized neutron scattering in determining the microscopic structures of magnetic thin-film superlattices of scientific and technological interest is briefly reviewed. In particular, the contribution which polarized-neutron reflectometry can make towards the understanding of the giant-magnetoresistance (GMR) effect, observed in some magnetic multilayer systems, is discussed in relation to current experimental and analysis capabilities. In addition, the development of a high-efficiency, supermirror transmission polarizer, an important instrumental component for such investigations, is described.
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