Advanced Test Solution for Data Dependent Jitter Characterization of Hsio on ATE

Abstract

Jitter is the core testing spec in HSIO device characterization phase. Normally peak-to-peak jitter is measured with spec search method on ATE. But it is not sufficient due to some advanced processors require to get the knowledge of sources of deterministic jitter, especially the Data dependent jitter. In this paper, an approach for measuring the DDJ on Advantest 93K test platform is introduced, and the correlation data with bench instrumentation is shown.