Abstract
This paper proposes an advanced signal processing technique for the precise estimation of a nonlinear ultrasonic parameter, based on power spectral and bispectral analysis. The power spectrum and bispectrum estimation of the pulse-like ultrasonic signal used in the commercial SAM (scanning acoustic microscopy) equipment is especially considered in this study. The usefulness of the proposed estimation is confirmed by experiments for a Newton ring with a continuous air gap and a real semiconductor sample with local delaminations. The results show that the nonlinear parameter obtained by the proposed method had a good correlation with the delamination.
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