Abstract
The rapid development of ferroelectric-based devices with reduced dimensions has generated a strong need for extensive investigation of the size effects in these materials. This chapter considers recent progress in the application of advanced modes of piezoresponse force microscopy (PFM) — such as such as resonance-enhanced PFM, stroboscopic PFM, and switching spectroscopy PFM — to the investigation of the static and dynamic properties of nanoscale ferroelectric structures.
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