Advanced modeling of faults in Reversible circuits

Abstract

This survey provides an overview of some recent developments in the testing and design validation of reversible logic circuits Reversible circuits are of interest in ultra-low-power design and in quantum information processing. We describe the fault and error models that have been proposed for these circuits and summarize their properties. We also discuss algorithms for automatic test pattern generation, design-for-testability techniques, and design debugging. We conclude by briefly examining the relationship between classical reversible circuits and quantum circuits.