Abstract
AbstractA comprehensive modeling approach for elucidating the intricacies of electro‐optic (EO) sampling is presented, which fully encapsulates the EO sampling process by accounting for all linear and second‐order nonlinear optical effects. The developed approach implements a multi‐step procedure, involving a vectorial‐field modeling of the second‐order nonlinear interactions occurring within the EO crystal, followed by a theoretical evaluation of the subsequent optical EO sampling components. To assess the efficacy of the approach, it is used for the sampling of terahertz electric fields (<1–>60 THz) within the bulk crystals of ZnTe and LiNbO3, as well as a ZnTe‐based waveguide. Nonetheless, this versatile method enables the investigation of EO sampling within any crystal incorporated within any geometry. This model provides a powerful tool for the in‐depth exploration of EO sampling, paving the way for advancements in various applications.
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