Advanced GPU-Based Terahertz Approach for In-Line Multilayer Thickness Measurements

Abstract

In this contribution, an advanced numerical regression approach based on graphics processing unit is introduced. The approach has been applied for real-time terahertz thickness measurements of individual layers within multilayered structures for a variety of industrial applications, including automotive paints, and ceramic coatings. In order to increase the sensitivity and the accuracy of the thickness measurements, a self-calibration method is presented, which can be applied for simultaneous material parameters extraction of all layers from the sample at its final state, taking into consideration all effects that may occur during the coating process.